Experimental optimal verification of three-dimensional entanglement on a silicon chip


High-dimensional entanglement is significant for the fundamental studies of quantum physics and offers unique advantages in various quantum information processing tasks. Integrated quantum devices have recently emerged as a promising platform for creating, processing, and detecting complex high-dimensional entangled states. A crucial step toward practical quantum technologies is to verify that these devices work reliably with an optimal strategy. In this work, we experimentally implement an optimal quantum verification strategy on a three-dimensional maximally entangled state using local projective measurements on a silicon photonic chip. A 95% confidence is achieved from 1190 copies to verify the target quantum state. The obtained scaling of infidelity as a function of the number of copies is −0.5497 ± 0.0002, exceeding the standard quantum limit of −0.5 with 248 standard deviations. Our results indicate that quantum state verification could serve as an efficient tool for complex quantum measurement tasks.

New Journal of Physics
Senior Researcher

My research focuses on characterizing, verifying, validating, mitigating, and correcting quantum errors inherent in quantum devices.